The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Jan. 23, 2012
Applicants:

Yen-hung Tu, Taipei, TW;

Chung-lin Chia, Zhongli, TW;

Han-chang Chen, New Taipei, TW;

Wen-chieh Pan, New Taipei, TW;

Inventors:

Yen-Hung Tu, Taipei, TW;

Chung-Lin Chia, Zhongli, TW;

Han-Chang Chen, New Taipei, TW;

Wen-Chieh Pan, New Taipei, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/14 (2006.01); G01B 21/16 (2006.01); G06F 3/041 (2006.01);
U.S. Cl.
CPC ...
G06F 3/041 (2013.01);
Abstract

A method and system for object location detection in a space, the method including the steps of: configuring the resolution of a multi dimensional sensing apparatus to divide a multi dimensional space into M first sub spaces; scanning the multi dimensional space to generate M first sensed data and at least one first locked space; configuring the resolution of the multi dimensional sensing apparatus to divide each of the at least one first locked space into N second sub spaces; scanning the at least one first locked space to generate at least one group of second sensed data and at least one second locked space; and combining at least one of the M first sensed data that corresponds to the at least one first locked space, with the at least one group of second sensed data to form a set of output sensed data.


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