The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Sep. 22, 2011
Applicants:

Enrico Bruzzano, Naples, IT;

Antonio Anastasio, Villaricca, IT;

Inventors:

Enrico Bruzzano, Naples, IT;

Antonio Anastasio, Villaricca, IT;

Assignee:

STMicroelectronics S.R.L., Agrate Brianza (MB), IT;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 31/00 (2006.01); G01R 31/02 (2006.01); G06F 3/00 (2006.01); G01R 31/3185 (2006.01); G11C 29/32 (2006.01); G11C 29/48 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318555 (2013.01); G11C 29/32 (2013.01); G11C 29/48 (2013.01); G01R 31/318572 (2013.01); G01R 31/318536 (2013.01);
Abstract

A driving circuit of a test access port is disclosed. The driving circuit includes an input terminal for receiving a first test data signal when the driving circuit is operating in an external test mode. The driving circuit is configured to receive a second test data signal (BS) carrying a test command to be executed on the test access port when the driving circuit is operating in an internal test mode. The driving circuit comprises a control logic circuit configured for processing the test command and generating therefrom an internal test data signal carrying the processed test command when the driving circuit is operating in the internal test mode. The driving circuit includes a selector configured for generating a selected test data signal, the selected test data signal being selected from the first test data signal when the driving circuit is operating in the external test mode.


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