The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Jul. 10, 2011
Applicants:

Allon Adir, Kiryat Tivon, IL;

Eyal Bin, Haifa, IL;

Shady Copty, Nazareth, IL;

Anatoly Koyfman, Kiriat Yam, IL;

Shimon Landa, Kiryat, IL;

Amir Nahir, Kfar Vitkin, IL;

Vitali Sokhin, Haifa, IL;

Elena Tsanko, Haifa, IL;

Inventors:

Allon Adir, Kiryat Tivon, IL;

Eyal Bin, Haifa, IL;

Shady Copty, Nazareth, IL;

Anatoly Koyfman, Kiriat Yam, IL;

Shimon Landa, Kiryat, IL;

Amir Nahir, Kfar Vitkin, IL;

Vitali Sokhin, Haifa, IL;

Elena Tsanko, Haifa, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01);
Abstract

An apparatus and a computer-implemented method performed by a computerized device, comprising: generating a collection of test data for testing one or more domains, wherein the test data is useful for post-silicon verification of hardware devices; selecting a subset of the collection of test data in accordance with a hardware device to be tested and at least one of the domains to be tested with respect to the hardware device; and indexing the subset of the collection of test data to obtain an indexed collection.


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