The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Jan. 14, 2009
Ralph Gericke, Gerhardshofen, DE;
Annette Gumbrecht, Herzogenaurach, DE;
Dorothea Laux, Erlangen, DE;
Diana Martin, Herzogenaurach, DE;
Mike Müller, Möhrendorf, DE;
Carsten Prinz, Erlangen, DE;
Ralph Gericke, Gerhardshofen, DE;
Annette Gumbrecht, Herzogenaurach, DE;
Dorothea Laux, Erlangen, DE;
Diana Martin, Herzogenaurach, DE;
Mike Müller, Möhrendorf, DE;
Carsten Prinz, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method for planning a combined examination of an examination object using two imaging modalities is disclosed, with measurements being taken in at least two regions of the examination object. In at least one embodiment, the method includes planning of at least one measuring protocol of the first modality, which includes at least one measurement in a first of the regions and at least one measurement in a second of the regions; planning of at least one measuring protocol of the second modality, which comprises at least one measurement in the first region; and automatic production of a combined measuring sequence by arranging the measurements in such a manner that carrying out the measuring sequence taking into account modality preparations to be carried out between measurements takes as little time as possible. In at least one embodiment, the automated production of the actual measuring sequence allows the measuring protocols of the individual modalities to be planned in a simple manner for a number of regions. The focus can therefore be on diagnostic questions at the measurement planning stage.