The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Dec. 19, 2012
Applicant:

Hong Kong Applied Science and Technology Research Institute Co., Ltd., Shatin, HK;

Inventor:

Chunhui Cui, Fanling, HK;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06T 3/40 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4053 (2013.01);
Abstract

Systems and methods which provide generation of high resolution depth maps from low resolution depth information using boundary-based processing techniques are disclosed. Boundary-based depth processing provided by embodiments implements boundary detection and boundary-based interpolation algorithms for providing high resolution depth information from low resolution depth information and high resolution image information. Boundary detection algorithms are implemented according to embodiments to detect object boundaries (e.g., depth discontinuities), where the low resolution depth samples are typically inaccurate and generally in need of refining. Boundary-based interpolation algorithms are implemented according to embodiments of the invention to refine intermediate upsampled depth information (e.g., spatially interpolated low resolution depth information), using the boundary information provided by a boundary detection algorithm, and provide high resolution depth information.


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