The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Jul. 31, 2012
Method, computing unit, ct system and c-arm system for reducing metal artifacts in ct image datasets
Applicants:
Marc Kachelriess, Nürnberg, DE;
Esther Meyer, Erlangen, DE;
Rainer Raupach, Heroldsbach, DE;
Inventors:
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/03 (2006.01); G06T 5/50 (2006.01); A61B 6/00 (2006.01); G06T 11/00 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/00 (2013.01); A61B 6/03 (2013.01); G06T 2207/10081 (2013.01); G06T 5/50 (2013.01); G06T 11/008 (2013.01); G06T 5/003 (2013.01); A61B 6/5282 (2013.01);
Abstract
A method is disclosed for reducing metal artifacts in CT image datasets. An embodiment of the method includes reconstructing a first CT image dataset with and a second CT image dataset without metal artifact correction, weighted summation of a high-pass-filtered first and a high-pass-filtered second CT image dataset plus a low-pass-filtered second CT image dataset, wherein the weightings are dependent on the proximity to metal in the CT image datasets. A computing unit, a CT system and a C-arm system designed to execute the method are also disclosed.