The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Jul. 10, 2012
Arcot J. Preetham, San Jose, CA (US);
Thomas J. Duerig, Sunnyvale, CA (US);
Charles J. Rosenberg, Cupertino, CA (US);
Yangli Hector Yee, San Francisco, CA (US);
Samy Bengio, Los Altos, CA (US);
Arcot J. Preetham, San Jose, CA (US);
Thomas J. Duerig, Sunnyvale, CA (US);
Charles J. Rosenberg, Cupertino, CA (US);
Yangli Hector Yee, San Francisco, CA (US);
Samy Bengio, Los Altos, CA (US);
Google Inc., Mountain View, CA (US);
Abstract
Methods, systems and apparatus for refining image relevance models. In general, one aspect of the subject matter described in this specification can be implemented in methods that include re-training an image relevance model by generating a first re-trained model based on content feature values of first images of a first portion of training images in a set of training images, receiving, from the first re-trained model, image relevance scores for second images of a second portion of the set of training images, removing, from the set of training images, some of the second images identified as outlier images for which the image relevance score received from the first re-trained model is below a threshold score, and generating a second re-trained model based on content feature values of the first images of the first portion and the second images of the second portion that remain following removal of the outlier images.