The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Nov. 02, 2004
Applicants:

Andrew Eames, Ashland, MA (US);

Brian V. Mirtich, Medfield, MA (US);

William M Silver, Weston, MA (US);

Inventors:

Andrew Eames, Ashland, MA (US);

Brian V. Mirtich, Medfield, MA (US);

William M Silver, Weston, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01);
Abstract

Disclosed are systems and methods for configuring a vision detector, wherein a training image is obtained from a production line operating in continuous motion so as to provide conditions substantially identical to those that will apply during actual manufacturing and inspection of objects. A training image can be obtained without any need for a trigger signal, whether or not the vision detector might use such a signal for inspecting the objects. Further disclosed are systems and methods for testing a vision detector by selecting, storing, and displaying a limited number of images from a production run, where those images correspond to objects likely to represent incorrect decisions.


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Eames, Andrew. (2014). Method and apparatus for configuring and testing a machine vision detector (U.S. Patent No. 8891852). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8891852

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