The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Sep. 28, 2012
Applicant:

Telesystems Co., Ltd., Osaka-shi, Osaka, JP;

Inventors:

Koichi Ogawa, Tokyo, JP;

Akitoshi Katsumata, Ichinomiya, JP;

Tsutomu Yamakawa, Osaka, JP;

Hideyuki Nagaoka, Osaka, JP;

Tatsuya Nagano, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/00 (2006.01); A61B 6/14 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5241 (2013.01); A61B 6/463 (2013.01); A61B 6/14 (2013.01); A61B 6/469 (2013.01);
Abstract

A panoramic imaging apparatus functionally includes an image processing apparatus. In this apparatus, two planar images are produced, which are subjected to registration. A registration process is applied to overall areas of two planar images based on curves decided from positions designated on the two planar images respectively. The positions on each of the planar images are aligned along a straight line, both straight lines corresponding to each other in a horizontal direction, and a scale factor for the registration is changed position by position on the straight lines. One of the two planar images is searched for a match of each local region of the other planar image, to any of regions of the one planar image, and images of the matched regions are re-produced to produce a planar image. The difference information is calculated between the planar images.


Find Patent Forward Citations

Loading…