The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Sep. 23, 2011
Masanori Hara, Tokyo, JP;
Hiroaki Toyama, Tokyo, JP;
Masanori Hara, Tokyo, JP;
Hiroaki Toyama, Tokyo, JP;
Nec Corporation, Tokyo, JP;
Abstract
Provided is a stripe pattern image analysis device by which a burden of an appraiser regarding a new charting point searching designation operation can be reduced. The device includes a charting point modification element obtaining or modifying a first point located on a first stripe pattern image displayed in a first window, and a second point which is corresponding to the first point and located on a second stripe pattern image displayed in a second window; a nonlinear coordinate transformation element transforming the first stripe pattern image using a nonlinear coordinate transformation so that a first coordinate of the first point in the first window matches a second coordinate of the second point in the second window; and a charting figure edit and display element displaying the first stripe pattern image, transformed by the nonlinear coordinate transformation element by use of the nonlinear coordinate transformation, in the first window.