The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Apr. 30, 2012
Gary K. Giust, Santa Clara, CA (US);
Gary K. Giust, Santa Clara, CA (US);
Other;
Abstract
An apparatus and method for receiving a signal waveform representing a signal-under-test (SUT), and a noise waveform representing noise measured in the absence of the SUT. An environment waveform is derived from the noise waveform and the signal waveform, and a jitter spectrum is computed from the environment waveform. An environment spur is detected, where the environment spur includes a spur in the jitter spectrum of the environment waveform. A jitter spectrum of the signal waveform is computed, and one or more signal spurs are detected, where the one or more signal spurs include one or more spurs in the jitter spectrum of the signal waveform. A measure of jitter for the SUT is derived from the one or more signal spurs after reducing the presence of at least one of the one or more signal spurs in response to detecting the environment spur.