The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Jan. 05, 2009
Applicant:

Dmitri Strukov, Mountain View, CA (US);

Inventor:

Dmitri Strukov, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2006.01); B82Y 10/00 (2011.01); G11C 13/00 (2006.01); H01L 27/10 (2006.01); G11C 11/34 (2006.01);
U.S. Cl.
CPC ...
H01L 27/10 (2013.01); G11C 2213/77 (2013.01); B82Y 10/00 (2013.01); G11C 2213/33 (2013.01); G11C 13/0002 (2013.01); G11C 2213/15 (2013.01); G11C 11/34 (2013.01); G11C 2213/81 (2013.01);
Abstract

A memristive device includes a first electrode; a second electrode; a junction between the first electrode and the second electrode, the junction including a semiconductor matrix and particles embedded in the semiconductor matrix, the particles being configured to hold a selectable level of electrical charge, the electrical charge controlling the amount of current flowing through the junction for a given reading voltage. A method for using a memristive device includes: applying a first voltage across a memristive junction, the memristive junction including a semiconductor matrix and particles embedded in the semiconductor matrix; electrical charges introduced into the semiconductor matrix by the first programming voltage being trapped within the particles; applying a reading voltage across the memristive junction; and measuring a current across the junction, the current being reduced proportionally to the electrical charges trapped within the potential wells, the current being used to determine a state of the junction.


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