The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Feb. 26, 2014
Applicant:

Marvell International Ltd., Hamilton, BM;

Inventors:

Bradley C. Aldrich, Austin, TX (US);

Moinul H. Khan, Austin, TX (US);

Kayla L. Chalmers, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/56 (2006.01); H04N 9/64 (2006.01); H04N 9/04 (2006.01);
U.S. Cl.
CPC ...
H04N 9/641 (2013.01); H04N 9/045 (2013.01);
Abstract

A system including an image data source and a transfer function module. The image data source is configured to provide image data. The transfer function module is configured to generate a transfer function to process the image data, define a first region of the transfer function, wherein a curvature of the transfer function in the first region is less than or equal to a threshold, define a second region of the transfer function, wherein a curvature of the transfer function in the second region is greater than the threshold, allocate a first number of sample inputs to the first region, allocate a second number of the sample inputs to the second region, wherein the second number is greater than the first number, map the sample inputs to sample outputs using the transfer function, and populate entries of a lookup table with the sample outputs.


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