The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Jul. 22, 2010
Applicant:

Ralph Dorfner, Oberding, DE;

Inventor:

Ralph Dorfner, Oberding, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
G03G 15/5062 (2013.01); G03G 2215/00067 (2013.01);
Abstract

In a method or device to control at least one property of a print image printed on a substrate, a first evaluation period is defined. A measurement value is determined with aid of an optical sensor which measures at least one determination point on the substrate within the first evaluation period, and also determining a position of the determination point within the first evaluation period. The determined measurement value is compared with a preset reference value. Depending on a result of the comparison, an inking of the substrate is controlled for the print image in at least one subsequent second evaluation period at a point within the second evaluation period which has a position within the second evaluation period that corresponds to said position of the determination point in said first evaluation period.


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