The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Dec. 18, 2012
Applicant:

Mediatek Inc., Hsin-Chu, TW;

Inventors:

Chung-Jen Kuo, Hsin-Chu, TW;

Pi-Hai Liu, Hsinchu County, TW;

Assignee:

Mediatek Inc., Science-Based Industrial Park, Hsin-Chu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/045 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
G06F 3/044 (2013.01);
Abstract

A method for detecting capacitance values of a plurality of capacitive sensing nodes located at intersections of a plurality of drive lines and a sense line on a touch panel is provided. The method includes at least the following steps: obtaining a plurality of touch sense signals corresponding to the sense line during a plurality of time slots, respectively; demodulating the touch sense signals with a first oscillation signal to generate a plurality of first demodulated signals; demodulating the touch sense signals with a second oscillation signal to generate a plurality of second demodulated signals, wherein the second oscillation signal is different from the first oscillation signal; and determining the capacitance values according to at least the first demodulated signals and the second demodulated signals.


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