The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Oct. 27, 2011
Applicants:

Gary Fred Wahlquist, McKinney, TX (US);

Kuang-yuh Wu, Plano, TX (US);

Inventors:

Gary Fred Wahlquist, McKinney, TX (US);

Kuang-Yuh Wu, Plano, TX (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/04 (2006.01); G01S 7/41 (2006.01); G01S 13/88 (2006.01);
U.S. Cl.
CPC ...
G01S 13/04 (2013.01); G01S 7/412 (2013.01); G01S 13/887 (2013.01);
Abstract

A method of detecting an object includes receiving first reflected radio frequency (RF) signals from a region using an antenna and generating a first backscattering signature of the region from the first reflected RF signals. The method further includes receiving second reflected RF signals from the region subsequent to receiving the first reflected RF signals and generating at least one second backscattering signature of the region from the second reflected RF signals. The method further includes detecting a difference between the first backscattering signature and the second backscattering signature, and providing a warning indication in response to the difference between the first backscattering signature and the second backscattering signature.


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