The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Feb. 19, 2013
Applicants:

Samsung Electronics Co., Ltd., Suwon-Si, KR;

Georgia Tech Research Corporation, Atlanta, GA (US);

Inventors:

Sung Yeol Kim, Yongin-si, KR;

Hyun Woo Choi, Atlanta, GA (US);

Nicholas Tzou, Atlanta, GA (US);

Xian Wang, Atlanta, GA (US);

Thomas Moon, Atlanta, GA (US);

Abhijit Chatterjee, Atlanta, GA (US);

Ho Sun Yoo, Seongnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/06 (2006.01); H03B 21/00 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1245 (2013.01); H03B 21/00 (2013.01); H03M 1/121 (2013.01);
Abstract

An apparatus for measuring a high speed signal may comprise a plurality of Analog-Digital converters (AD converter) that are arranged in parallel to each other to sample an input signal at different frequencies; a plurality of frequency synthesizers configured to provide each AD converter with a different sampling frequency; a signal processor configured to receive an output of the plurality of AD converters to reconstruct the input signal; and/or a controller configured to receive and process a trigger signal.


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