The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Jun. 01, 2011
Applicants:

Daniel James Twitchen, Ascot, GB;

Sarah Louise Geoghegan, Ascot, GB;

Neil Perkins, Ascot, GB;

Inventors:

Daniel James Twitchen, Ascot, GB;

Sarah Louise Geoghegan, Ascot, GB;

Neil Perkins, Ascot, GB;

Assignee:

Element Six Limited, Ballasalla, IM;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C01B 31/06 (2006.01); C09K 3/14 (2006.01); B24D 99/00 (2010.01); C30B 33/04 (2006.01); C30B 29/04 (2006.01); B24D 18/00 (2006.01);
U.S. Cl.
CPC ...
C09K 3/14 (2013.01); B24D 99/00 (2013.01); C01B 31/065 (2013.01); C30B 33/04 (2013.01); C09K 3/1409 (2013.01); C30B 29/04 (2013.01); B24D 18/00 (2013.01);
Abstract

A method comprising: selecting a diamond material; irradiating the diamond material to increase toughness and/or wear resistance of the diamond material; and processing the diamond material into one or more diamond tool pieces, wherein the diamond material is selected from the group consisting of: a HPHT diamond material having a total equivalent isolated nitrogen concentration in the range 1 to 600 ppm; a CVD diamond material having a total equivalent isolated nitrogen concentration in the range 0.005 to 100 ppm; and a natural diamond material having a total nitrogen concentration in the range 1 to 2000 ppm, wherein the irradiating comprises controlling energy and dosage of irradiation to provide the diamond material with a plurality of isolated vacancy point defects, the isolated vacancy point defects having a concentration in a range 1×10to 1×10vacancies/cm.


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