The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Jun. 18, 2013
Agilent Technologies, Inc., Loveland, CO (US);
Noah Goldberg, Palo Alto, CA (US);
James L. Bertsch, Palo Alto, CA (US);
David Deford, Pleasanton, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
An ion detection system for detecting ions whose velocity varies during an operating cycle. The ion detection system includes a dynode electron multiplier (e.g., a microchannel plate (MCP)) having a bias voltage input, and a bias voltage source to apply a bias voltage to the bias voltage input of the dynode electron multiplier. With a fixed bias voltage applied to its bias voltage input, the dynode electron multiplier has a gain dependent on the velocity of ions incident thereon. The bias voltage applied by the bias voltage source to the bias voltage input of the dynode electron multiplier varies during the operating cycle to reduce the dependence of the gain of the dynode electron multiplier on the velocity of the ions incident thereon.