The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Mar. 28, 2012
Mostafa A. Karam, Moorpark, CA (US);
A. Douglas Meyer, Woodland Hills, CA (US);
Charles H. Volk, Newbury Park, CA (US);
Azmat H. Siddiqi, Belmont Shore, CA (US);
Mostafa A. Karam, Moorpark, CA (US);
A. Douglas Meyer, Woodland Hills, CA (US);
Charles H. Volk, Newbury Park, CA (US);
Azmat H. Siddiqi, Belmont Shore, CA (US);
Northrop Grumman Guidance and Electronics Company, Inc., Woodland Hills, CA (US);
Abstract
One embodiment of the invention includes a material detection and/or identification system. The system includes an electromagnetic (EM) sensor system configured to collect EM radiation from a region of interest. The collected EM radiation could comprise orthogonally-polarized EM radiation. The system also includes a processing unit configured to detect and identify a material of interest in the region of interest. As an example, the processing unit could measure reflectivity data associated with a material of interest based on the collected EM radiation and calculate a refractive index of a material of interest based on the measured reflectivity data, such that the material of interest is identified based on the refractive index. The processing unit can also be configured to calculate a surface roughness associated with the material, such that the refractive index can be calculated based on the surface roughness associated with the material.