The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Nov. 21, 2012
Applicant:

Dh Technologies Development Pte. Ltd., Singapore, SG;

Inventors:

John Lawrence Campbell, Milton, CA;

Yves LeBlanc, Newmarket, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01); H01J 49/10 (2006.01); H01J 49/06 (2006.01); B01D 59/44 (2006.01); G01N 27/62 (2006.01);
U.S. Cl.
CPC ...
G01N 27/624 (2013.01);
Abstract

An apparatus and method are provided for analyzing samples of molecules. The apparatus comprises a mass analysis system including a differential mobility spectrometer, which includes at least three filter electrodes defining two ion flow paths where the filter electrodes generate electric fields for passing through selected portions of the sample ions based on the mobility characteristics of the sample ions. The differential mobility spectrometer also includes a voltage source that provides DC and RF voltages to at least one of the filter electrodes to generate the electric field, a first and a second ion inlet that receive sample ions, and an ion outlet that outputs the selected portion of the sample ions. A mass spectrometer receives some or all of the selected portion of the sample ions.


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