The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Sep. 05, 2012
Applicants:

Friedhelm Dorsch, Stuttgart, DE;

Holger Braun, Renningen, DE;

Dieter Pfitzner, Althengstett, DE;

Inventors:

Friedhelm Dorsch, Stuttgart, DE;

Holger Braun, Renningen, DE;

Dieter Pfitzner, Althengstett, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 31/00 (2006.01); B23K 26/02 (2014.01); B23K 26/03 (2006.01); B23K 26/20 (2014.01); B23K 26/24 (2014.01); B23K 31/12 (2006.01);
U.S. Cl.
CPC ...
B23K 26/032 (2013.01); B23K 26/24 (2013.01); B23K 31/125 (2013.01); B23K 31/00 (2013.01); B23K 26/03 (2013.01); B23K 26/02 (2013.01); B23K 26/20 (2013.01);
Abstract

This disclosure relates to verifying a seam quality during a laser welding process. In certain aspects, a method includes detecting, in a spatially resolved manner, a first amount of radiation emerging from a workpiece in a first wavelength range, determining a first geometric parameter of a seam characteristic based on the first amount of radiation detected in the first wavelength range, detecting, in a spatially resolved manner, a second amount of radiation emerging from the workpiece in a second wavelength range, the second wavelength range being different than the first wavelength range, determining a second geometric parameter of the seam characteristic based on the second amount of radiation detected in the second wavelength range, comparing the first and second geometric parameters to respective reference values or to respective tolerance intervals to provide respective comparison results, and logically combining the respective comparison results to verify the seam quality.


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