The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Jul. 23, 2009
Fuminobu Sato, Osaka, JP;
Hiroshi Nagao, Osaka, JP;
Takashi Kimura, Osaka, JP;
Mizuno Corporation, Osaka, JP;
Abstract
A measuring device includes a strain gauge, a processing unit calculating an expected bending point value corresponding to a bending point position, and a display unit capable of displaying an output value from the processing unit. The processing unit calculates the expected bending point value based on a measured value of strain gauge at a first time point during a swing of the user and a measured value of strain gauge at a second time point closer to an impact time point than the first time point. The processing unit stores in advance conversion data for converting the expected bending point value to recommended kick point output value indicating kick point, and the processing unit outputs the recommended kick point output value corresponding to the calculated expected bending point value to the display unit.