The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Feb. 08, 2011
Applicants:

Helmut Altheimer, Baisweil-Lauchdorf, DE;

Wolfgang Becken, Munich, DE;

Gregor Esser, Munich, DE;

Dietmar Uttenweiler, Icking, DE;

Martin Zimmermann, Erdweg-Kleinberghofen, DE;

Inventors:

Helmut Altheimer, Baisweil-Lauchdorf, DE;

Wolfgang Becken, Munich, DE;

Gregor Esser, Munich, DE;

Dietmar Uttenweiler, Icking, DE;

Martin Zimmermann, Erdweg-Kleinberghofen, DE;

Assignee:

Rodenstock GmbH, Munich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02C 7/02 (2006.01); G02C 7/06 (2006.01);
U.S. Cl.
CPC ...
G02C 7/065 (2013.01); G02C 7/028 (2013.01); G02C 7/027 (2013.01);
Abstract

A method, a system and a computer program product are provide for optimizing a spectacle lens for a wearer with a selectable quality grade. In particular, a set of individual parameters is determined for the wearer and a desired quality grade is identified. Depending the identified quality grade, the set of individual parameters is adapted and a surface of the spectacle lens is calculated based on the adapted set of individual parameters.


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