The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2014

Filed:

Oct. 29, 2010
Applicant:

Robert C Henderson, Avondale, PA (US);

Inventor:

Robert C Henderson, Avondale, PA (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/22 (2006.01); G01M 3/32 (2006.01);
U.S. Cl.
CPC ...
G01M 3/3254 (2013.01); G01N 2001/2229 (2013.01);
Abstract

The present invention relates to methods and systems for detecting leaks in a head space sampling device. One exemplary method for detecting leaks in a head space sampling device includes establishing fluid communication between a head space and a pressurization gas conduit. Gas pressure and flow rate are monitored within the pressurization gas conduit during pressurization of the head space. Changes in monitored gas pressure and flow rate are used to evaluate whether a leak exists within the head space sampling device or the vial containing the head space. One exemplary head space sampling device includes a conduit for receiving a pressurization gas, flow and pressure sensors for measuring gas flow and pressure within the conduit, a ventilation valve, a pressure valve for controlling gas flow through the conduit, and a controller for processing and controlling pressure and flow through the conduit.


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