The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2014

Filed:

Nov. 14, 2012
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Rachel Tzoref-Brill, Haifa, IL;

Itai Segall, Tel Aviv, IL;

Aviad Zlotnick, Mitzpeh Netofah, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5045 (2013.01);
Abstract

A computer-implemented method, computerized apparatus, and computer program product for test validation planning. The computer-implemented method, performed by a processor, comprising: having a test validation activity to be performed to validate results of two or more tests of a test suite; and automatically determining, by a processor, a subset of the two or more tests for which to perform the test validation activity; whereby avoiding performing duplicate validation activities. Optionally, for each test of the test suite a valuation of a set of functional attributes is available, and a subset of the functional attributes is deemed as relevant functional attributes with respect to the test validation activity. In such an embodiment, said determining is based on the valuation of the relevant functional attributes.


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