The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2014

Filed:

Feb. 13, 2012
Applicants:

Thiam Sin Lai, Bayan Lepas, MY;

Siew Leong Lam, Petaling Jaya, MY;

Inventors:

Thiam Sin Lai, Bayan Lepas, MY;

Siew Leong Lam, Petaling Jaya, MY;

Assignee:

Altera Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

An integrated circuit (IC) is provided. The IC includes a transceiver, a boundary scan chain and a plurality of routable pathways. The transceiver includes an interconnection coupling circuit components. The transceiver receives data and transfers the received data through the interconnection. The received data is utilized to test the interconnection between the circuit components. The transceiver deserializes the data once the data completes its propagation through the interconnection. The boundary scan chain receives and shifts the deserialized data from the transceiver and transfers the shifted deserialized data out of the IC. The shifting is performed when asserted with an instruction of an Input Output (IO) standard. The plurality of routable pathways provides a pathway between the transceiver and the boundary scan chain so that the deserialized data may propagate.


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