The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
Jul. 16, 2012
Applicants:
Yu-seung MA, Daejeon-si, KR;
Seon-tae Kim, Daejeon-si, KR;
Inventors:
Yu-Seung Ma, Daejeon-si, KR;
Seon-Tae Kim, Daejeon-si, KR;
Assignee:
Electronics and Telecommunications Research Institute, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01);
Abstract
A low cost error-based program testing apparatus and method are provided. The testing apparatus according to an embodiment of the present invention generates error programs by adding errors to a test target program, selects a test target error program associated with test data among the error programs using error information obtained through the error addition, receives the test data to execute the test target error program, and tests for presence/absence of the errors. Accordingly, it is possible to reduce a text execution time and testing costs.