The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
Sep. 14, 2011
Ching-chun Lin, New Taipei, TW;
Chih-wei Tang, Penghu County, TW;
Hsueh-yi Lee, Hsinchu County, TW;
Yu-hsun Peng, Hsinchu County, TW;
Ching-Chun Lin, New Taipei, TW;
Chih-Wei Tang, Penghu County, TW;
Hsueh-Yi Lee, Hsinchu County, TW;
Yu-Hsun Peng, Hsinchu County, TW;
NOVATEK Microelectronics Corp., Hsinchu Science Park, Hsin-Chu, TW;
Abstract
In calibration mode, a clock signal and a data signal are respectively transmitted via a clock lane and a data lane of an MIPI. A test clock signal is provided by adjusting the phase of the clock signal, and a test data signal is provided by adjusting the phase of the data signal. By latching the test data signal according to the test clock signal, a latched data may be acquired for determining an optimized phase relationship corresponding to the clock lane and the data lane. When transmitting the clock signal and the data signal in normal mode, the signal delays of the clock lane and the data lane may be adjusted according to the optimized phase relationship.