The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2014

Filed:

Jun. 12, 2012
Applicants:

Chao Yuan, Plainsboro, NJ (US);

Amit Chakraborty, East Windsor, NJ (US);

Leif Wiebking, Karlsruhe, DE;

Holger Hackstein, Dietzenbach, DE;

Inventors:

Chao Yuan, Plainsboro, NJ (US);

Amit Chakraborty, East Windsor, NJ (US);

Leif Wiebking, Karlsruhe, DE;

Holger Hackstein, Dietzenbach, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G05B 23/02 (2006.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G05B 23/024 (2013.01); G05B 23/0205 (2013.01); G06N 99/005 (2013.01); Y10S 706/904 (2013.01);
Abstract

A generalized pattern recognition is used to identify faults in machine condition monitoring. Pattern clusters are identified in operating data. A classifier is trained using the pattern clusters in addition to annotated training data. The operating data is also used to cluster the signals in the operating data into signal clusters. Monitored data samples are then classified by evaluating confidence vectors that include substitutions of signals contained in the training data by signals in the same signal clusters as the signals contained in the training data.


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