The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2014

Filed:

Nov. 16, 2011
Applicants:

Jean-baptiste Thibault, Waukesha, WI (US);

Jiang Hsieh, Brookfield, WI (US);

Thomas Matthew Benson, Smyrna, GA (US);

Inventors:

Jean-Baptiste Thibault, Waukesha, WI (US);

Jiang Hsieh, Brookfield, WI (US);

Thomas Matthew Benson, Smyrna, GA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
G06K 9/36 (2013.01); G06T 11/003 (2013.01);
Abstract

Methods and apparatus for statistical iterative reconstruction are provided. One method includes pre-processing acquired raw measurement data to modify the raw data measurement data and determining a change in a variance of the raw measurement data resulting from the modification to the raw measurement data during pre-processing. The method also includes reconstructing an image using the modified raw measurement data resulting from the pre-processing and the determined change in variance.


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