The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2014

Filed:

Nov. 29, 2012
Applicant:

The Hong Kong Polytechnic University, Hong Kong, CN;

Inventors:

Edmond W. W. Chan, Hong Kong, CN;

Xiapu Luo, Hong Kong, CN;

Rocky K. C. Chang, Hong Kong, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/0864 (2013.01); H04L 43/12 (2013.01); H04L 43/0882 (2013.01); H04L 43/10 (2013.01);
Abstract

Disclosed is a method for achieving efficient and accurate measurement of path capacities of a communication network. The method includes the following steps: (a) transmitting a number of probes from a local node to a remote node over a forward network path, each probe contains at least one probe packet and can elicit the remote node to transmit a number of response packets to the local node over a reverse network path; (b) determine for each response packet a minimum round-trip packet delay between the time transmitting the probe and the time receiving the response packet; (c) calculate a number of pair-wise minimum delay differences from the minimum round-trip packet delays. The number of pair-wise minimum delay differences can be used as a measurement of the forward capacity, reverse capacity, faster-path capacity, slower-path capacity and a degree of capacity asymmetry between the local node and the remote node.


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