The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2014

Filed:

Oct. 18, 2013
Applicant:

Hgst Netherlands B.v., Amsterdam, NL;

Inventors:

Masaru Furukawa, Fujisawa, JP;

Junguo Xu, Kasumigaura, JP;

Jianhua Li, Sagamihara, JP;

Makoto Satou, Hiratsuka, JP;

Kenichiro Takahashi, Fujisawa, JP;

Assignee:

HGST Netherlands B.V., Amsterdam, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, apparatus, and system are provided for implementing enhanced surface analysis test (SAT) function for microwave assisted magnetic recording (MAMR) hard disk drives (HDDs) using embedded contact sensor (ECS) and spin-torque oscillator (STO) signals. A preamplifier circuit receives the embedded contact sensor (ECS) and spin-torque oscillator (STO) signals and compares the received ECS and STO signals to identify magnetic disk media defects including bumps or thermal-asperity (TA) defects and pits or hole defects.


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