The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
Aug. 18, 2009
Applicants:
Masao Doi, Fuchu, JP;
Toshio Yamazaki, Mitaka, JP;
Inventors:
Masao Doi, Fuchu, JP;
Toshio Yamazaki, Mitaka, JP;
Assignee:
Mitaka Kohki Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); A61B 19/00 (2006.01);
U.S. Cl.
CPC ...
A61B 19/5223 (2013.01);
Abstract
Only a front end partof a surgical microscopeis turned in a left-right direction X around a main axis S, so that an observation angle of a surgical site T is freely changed in the left-right direction. Even if the observation angle is changed, the orientation of eyepiecesis unchanged, and therefore, an operator does not need to bend his or her neck and no burden is imposed on the neck of the operator even if the operator must conduct an operation that takes a long time.