The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2014

Filed:

Oct. 01, 2013
Applicant:

Keyence Corporation, Osaka, JP;

Inventor:

Jun Tabuchi, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01);
Abstract

The invention provides a shape measuring device, a shape measuring method, and a shape measuring program capable of accurately and easily positioning a measuring object at a focus of a light receiving unit when measuring the shape of the measuring object. An image of a measuring object captured by a light receiving unit is displayed on a display section, and an arbitrary position on the image of the measuring object is specified by a user. A relative distance between the light receiving unit and a stage is changed so that the specified position coincides with a focus of the light receiving unit. The light emitted from a light projecting unit is reflected by the measuring object and received by the light receiving unit. Stereoscopic shape data of the measuring object is generated by a triangular distance measuring method based on a light receiving signal output by the light receiving unit.


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