The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
Feb. 19, 2010
Pascal Jourdain, Sergy, FR;
Etienne Cuche, Maracon, CH;
Christian Depeursinge, Preverenges, CH;
Pierre Julius Magistretti, Epalinges, CH;
Pierre Marquet, Cheseaux-sur-Lausanne, CH;
Pascal Jourdain, Sergy, FR;
Etienne Cuche, Maracon, CH;
Christian Depeursinge, Preverenges, CH;
Pierre Julius Magistretti, Epalinges, CH;
Pierre Marquet, Cheseaux-sur-Lausanne, CH;
Lyncee Tec S.A., Lausanne, CH;
Abstract
Apparatus and method are provided for monitoring and measuring matter and energy fluxes by use of devices able to detect refractive index changes. In one aspect, apparatus use an interference between two electromagnetic radiations in order to provide high sensitivity, enabling fluxes monitoring at the microscopic scale, by measuring phase changes or Optical Path Length (OPL) changes. In one aspect, methods are provided for monitoring and measuring the electrical activity of a biological cells, simultaneously on several cells, without use of electrodes and contrast agents.