The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
Dec. 23, 2009
Marian L. Morys, Downingtown, PA (US);
Steve Zannoni, Houston, TX (US);
Christopher M. Jones, Houston, TX (US);
Marian L. Morys, Downingtown, PA (US);
Steve Zannoni, Houston, TX (US);
Christopher M. Jones, Houston, TX (US);
Halliburton Energy Services, Inc., Houston, TX (US);
Abstract
Various systems and methods for performing optical analysis downhole with an interferogram (a light beam having frequency components with a time variation that identifies those frequency components. The interferogram is produced by introducing an interferometer into the light path, with the two arms of the interferometer having a propagation time difference that varies as a function of time. Before or after the interferometer, the light encounters a material to be analyzed, such as a fluid sample from the formation, a borehole fluid sample, a core sample, or a portion of the borehole wall. The spectral characteristics of the material are imprinted on the light beam and can be readily analyzed by processing electronics that perform a Fourier Transform to obtain the spectrum or that enable a comparison with one or more templates. An interferometer designed to perform well in the hostile environments downhole is expected to enable laboratory-quality measurements.