The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2014

Filed:

Nov. 06, 2012
Applicant:

Olympus Corporation, Tokyo, JP;

Inventor:

Masaharu Tomioka, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/18 (2006.01); G02B 21/00 (2006.01); G01J 3/06 (2006.01); G01J 3/02 (2006.01); G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0076 (2013.01); G01J 3/1838 (2013.01); G01J 3/06 (2013.01); G01J 3/0208 (2013.01); G01J 3/021 (2013.01); G02B 21/0064 (2013.01); G01J 3/0237 (2013.01); G01J 3/4406 (2013.01);
Abstract

Provided is a detection optical system that is provided with a dispersed-light detection function and that can increase the amount of detected light by enhancing the diffraction efficiency. A detection optical system is employed which includes a transmissive VPH diffraction grating that disperses fluorescence from a specimen into a plurality of wavelength bands; a rotating mechanism that rotates the VPH diffraction grating about an axial line that is perpendicular to an incident optical axis of the fluorescence from the specimen and an emission optical axis from the VPH diffraction grating; a light detection portion that detects the fluorescence from the specimen that has been dispersed by the VPH diffraction grating; and a correcting portion that corrects an incident position on the light detection portion in accordance with a displacement of the optical axis caused by the rotation of the VPH diffraction grating in synchronization with the rotating mechanism.


Find Patent Forward Citations

Tomioka, Masaharu. (2014). Detection optical system and scanning microscope (U.S. Patent No. 8885162). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8885162

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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