The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
Feb. 23, 2010
Applicants:
Edward J. Bawolek, Chandler, AZ (US);
Curtis D. Moyer, Phoenix, AZ (US);
Sameer M. Venugopal, San Jose, CA (US);
Inventors:
Edward J. Bawolek, Chandler, AZ (US);
Curtis D. Moyer, Phoenix, AZ (US);
Sameer M. Venugopal, San Jose, CA (US);
Assignee:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G01R 31/2621 (2013.01); G01R 31/2642 (2013.01); G01R 31/2607 (2013.01); G01R 31/26 (2013.01); G09G 2320/0295 (2013.01); G09G 2330/04 (2013.01); G09G 2330/10 (2013.01); G09G 2330/12 (2013.01);
Abstract
The present invention provides devices and methods for testing the electrical performance of thin-film transistor backplane arrays and protecting thin-films during testing and handling.