The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2014

Filed:

Mar. 25, 2010
Applicants:

Barbara Anderson, Brookfield, CT (US);

Thomas D. Barber, Houston, TX (US);

Emmanuel Legendre, Sevres, FR;

Martin G. Luling, Paris, FR;

Pabitra N. Sen, Chapel Hill, NC (US);

Reza Taherian, Sugar Land, TX (US);

Inventors:

Barbara Anderson, Brookfield, CT (US);

Thomas D. Barber, Houston, TX (US);

Emmanuel Legendre, Sevres, FR;

Martin G. Luling, Paris, FR;

Pabitra N. Sen, Chapel Hill, NC (US);

Reza Taherian, Sugar Land, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/12 (2006.01); G01V 3/38 (2006.01);
U.S. Cl.
CPC ...
G01V 3/38 (2013.01);
Abstract

A method for determining the frequency-dependent dielectric permittivity spectrum of a rock sample, comprising:—defining a series of electromagnetic measurement data comprising at least a first measurement at a frequency from which a substantially frequency-independent value of dielectric permittivity ∈, can be obtained; and at least second and third measurements at different frequencies from which values for frequency-dependent dielectric permittivity ∈(f) can be obtained; and—using the first, second and third measurements to determine the frequency-dependent spectrum of the sample.


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