The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
Oct. 31, 2011
Changting Wang, Niskayuna, NY (US);
Yuri Alexeyevich Plotnikov, Niskayuna, NY (US);
Mandar Diwakar Godbole, Bangalore, IN;
Aparna Chakrapani Sheila-vadde, Bangalore, IN;
Changting Wang, Niskayuna, NY (US);
Yuri Alexeyevich Plotnikov, Niskayuna, NY (US);
Mandar Diwakar Godbole, Bangalore, IN;
Aparna Chakrapani Sheila-Vadde, Bangalore, IN;
General Electric Company, Niskayuna, NY (US);
Abstract
Present embodiments include eddy current array probes having differential coils capable of detecting both long and short flaws in a test specimen and, additionally or alternatively, multiplexed drive coils. For example, an eddy current array probe may include a first plurality of eddy current channels disposed in a first row and a second plurality of eddy current channels disposed in a second row. The first plurality and second plurality of eddy current channels overlap in a first direction but do not overlap in a second direction. The probe also includes a semi-circular drive coil disposed proximate to the first plurality and second plurality of eddy current channels and configured to generate a probing magnetic field for each sense coil of the eddy current channels.