The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2014

Filed:

Jul. 02, 2012
Applicants:

Ronald Grazioso, Knoxville, TN (US);

Debora Henseler, Erlangen, DE;

Nan Zhang, Knoxville, TN (US);

Inventors:

Ronald Grazioso, Knoxville, TN (US);

Debora Henseler, Erlangen, DE;

Nan Zhang, Knoxville, TN (US);

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/202 (2006.01); G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
G01T 1/248 (2013.01); G01T 1/202 (2013.01);
Abstract

Systems and methods for correcting output signals from non-linear photosensors, specifically silicon photomultipliers (SiPMs). SiPMs are used in a PET detector to readout light emissions from LSO scintillator crystals. The non-linear output of the SiPM can distort and compress the energy spectrum which is crucial in PET imaging. The non-linearity effect for inter-crystal scattered events can place an energy event outside of the PET detector energy window, resulting in a rejected event. Systems and methods to correct the SiPM non-linearity for inter-crystal scattered events, so as to be able to obtain the proper energy event and produce an accurate medical image, are disclosed.


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