The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
Jun. 29, 2009
Valerie Carol Tucker, Birmingham, GB;
Pieris Koumi, Birmingham, GB;
Andrew John Hopwood, Birmingham, GB;
Keith Elliot, Birmingham, GB;
Valerie Carol Tucker, Birmingham, GB;
Pieris Koumi, Birmingham, GB;
Andrew John Hopwood, Birmingham, GB;
Keith Elliot, Birmingham, GB;
Qiagen GmbH, Hilden, DE;
Abstract
A size standard, kit includes a size standard, method of defining a size standard and method of analysis using a size standard. The size standard is intended to include size standard elements which have a size greater than and/or less than and/or different from the components of a sample which are to be sized. This means that the same characteristic unit, such as a dye, can be used to label the component and the size standard. A further characteristic unit, from amongst a limited number of such characteristic units is liberated from use only on size standards for use on components. The method is therefore particularly useful in multiplex amplification of STRs.