The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
Jan. 30, 2012
Jesse R. Boyer, Manchester, CT (US);
Jeffry K. Pearson, Newport Beach, CA (US);
Randall W. Joyner, Union, CT (US);
Jesse R. Boyer, Manchester, CT (US);
Jeffry K. Pearson, Newport Beach, CA (US);
Randall W. Joyner, Union, CT (US);
United Technologies Corporation, Hartford, CT (US);
Abstract
A method for creating an artifact for use with an optical three-dimensional measuring system includes steps of: (a) providing an artifact that comprises an inspection surface, which artifact is configured to be scanned by a non-contact sensor included in the optical three-dimensional measuring system, which artifact comprises at least one of a substantially spherical body and a turbine engine component, and which inspection surface comprises a surface of one of the substantially spherical body and the turbine engine component; (b) heating the artifact to a predetermined temperature; and (c) coating the inspection surface of the heated artifact with an approximately uniform coating of dry film lubricant.