The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
Dec. 07, 2012
Applicant:
Leica Microsystems (Schweiz) Ag, Heerbrugg, CH;
Inventor:
Ulrich Sander, Rebstein, CH;
Assignee:
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); A61B 3/13 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/13 (2013.01);
Abstract
A surgical microscope system () for ophthalmology, in particular for cataract surgery, comprising a surgical microscope () having an optical viewing unit (), is proposed, in which an optical coherence tomograph () is set up to scan at least a region of a lens () of an eye () and to generate scan values, and in which a detection unit () is set up to generate, on the basis of the scan values, diagnostic data that correspond to light-reflecting structures in the scanned region of the eye () and that derive from a plane of the eye () that corresponds to an object plane of the surgical microscope ().