The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
Feb. 26, 2013
The Boeing Company, Chicago, IL (US);
Frederic P. Berg, Seattle, WA (US);
Mark F. Gabriel, Renton, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A system for inspecting an aperture is disclosed. The aperture has an axis, a design geometric parameter, an actual geometric parameter, and a depth. The system includes a first measuring probe configured to produce a signal indicative of the actual geometric parameter of the aperture when inserted therein; a deployment mechanism supporting the first measuring probe and attachable to a robotic device, the deployment mechanism configured to selectively orient the first measuring probe along the axis of the aperture; and a controller, couplable to the robotic device, the first measuring probe, and the deployment mechanism. The controller is configured to cause insertion of the first measuring probe into the aperture substantially along the axis and to receive the signal from the probe.