The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2014
Filed:
May. 17, 2010
Pierre Ueberschlag, Saint-Louis, FR;
Pierre Ueberschlag, Saint-Louis, FR;
Endress + Hauser Flowtec AG, Reinach, CH;
Abstract
Method and measuring device for measuring at least one measured variable. A first sensor transmits a first measurement signal, which includes at least one half-wave of a mechanical wave or an electromagnetic wave, and, at a time t from the first measurement signal, transmits at least a second measurement signal. At least a second sensor receives the measurement signals. The travel time and TOFof the first measurement signal between transmitting of the first measurement signal and receiving of the first measurement signal is known, wherein the time t is so selected that it is a whole numbered multiple of the travel time TOFof the first measurement signal or that it is a whole numbered multiple of the average value of the travel times TOFand TOF, wherein the travel time and TOF2 between transmitting a third measurement signal from the second sensor and receiving of the third measurement signal by the first sensor is known.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile