The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2014

Filed:

Mar. 29, 2012
Applicants:

Hitoshi Harada, Foster City, CA (US);

Caleb E. Welton, Foster City, CA (US);

Gavin Sherry, Beaune, FR;

Inventors:

Hitoshi Harada, Foster City, CA (US);

Caleb E. Welton, Foster City, CA (US);

Gavin Sherry, Beaune, FR;

Assignee:

Pivotal Software, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Inverse distribution operations are performed on a large distributed parallel database comprising a plurality of distributed data segments to determine a data value at a predetermined percentile of a sorted dataset formed on one segment. Data elements from across the segments may be first grouped, either by partitioning keys or by hashing, the groups are sorted into a predetermined order, and data values corresponding to the desired percentile are picked up at a row location of the corresponding data element of each group. For a global dataset that is spread across the database segments, a local sort of data elements is performed on each segment, and the data elements from the local sorts are streamed in overall sorted order to one segment to form the sorted dataset.


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