The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2014

Filed:

Jan. 31, 2012
Applicants:

Michael G. Zemore, King George, VA (US);

Robert C. Heflin, Jr., Fredericksburg, VA (US);

Shannon S. Jernigan, King George, VA (US);

Charles S. Rozanski, Hughesville, MD (US);

Graham C. Pierson, Fredericksburg, VA (US);

Kevin G. Stottlar, Fredericksburg, VA (US);

Regina A. Eller, King George, VA (US);

Gary D. Smoller, King George, VA (US);

Inventors:

Michael G. Zemore, King George, VA (US);

Robert C. Heflin, Jr., Fredericksburg, VA (US);

Shannon S. Jernigan, King George, VA (US);

Charles S. Rozanski, Hughesville, MD (US);

Graham C. Pierson, Fredericksburg, VA (US);

Kevin G. Stottlar, Fredericksburg, VA (US);

Regina A. Eller, King George, VA (US);

Gary D. Smoller, King George, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/00 (2006.01); G06F 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer-implemented method is provided for performing mishap risk assessment within a system. The method includes providing a first set of data including risk information associated with at least one hazard within the system, correlating all input first set of data with a second set of data defined as a plurality of mishaps of the system such that the hazard correlates with each mishap to assess mishap potential, storing the correlated first and second sets of data, and performing mishap risk assessment within the system based the correlated data including the first and second sets of data.


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