The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2014

Filed:

Mar. 22, 2013
Applicant:

Alenia Aermacchi S.p.a., Venegono Superiore, IT;

Inventors:

Antonio Piccolo, Naples, IT;

Gaetana Mastroianni, Frignano, IT;

Sandro Migliore, Naples, IT;

Assignee:

Alenia Aermacchi S.p.A., Venegono Superiore, IT;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E01C 9/00 (2006.01); G01B 21/30 (2006.01); G08G 5/00 (2006.01);
U.S. Cl.
CPC ...
E01C 9/00 (2013.01); G01B 21/30 (2013.01); G08G 5/00 (2013.01);
Abstract

A method for evaluating the structural compatibility of an aircraft for use on a runway having a profile with one or more roughnesses in the form of bumps and/or dips using a computer-based system, and including the steps of: generating a first bump height curve representing elevations or depressions on the runway; comparing the bump height curve with a second bump height curve which is a first reference curve; generating a first power spectral density curve of the profile of the runway; comparing the first power spectral density curve with a second power spectral density curve which is a second reference curve; and authorizing or denying the aircraft the use of the runway on the basis of results of the comparison.


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